N-SIS III, the light source system for CCD test designed to be used in wafer level inspection and final inspection as well.
CCDs are getting heavy demand as the eyes of camcorders and digital cameras.
N-SISIII generates programmed light which meets any kind of functional tests in wafer level or in final stage.
Thanks to the high intensity of light and quick movement of mechanism, N-SISIII does improve throughput and increase your yield.